New Arrivals

Optical Chirpform Test Set. Wavelength Measurement Range: 1530 to 1580 nm. Input Optical Power Range: -10 to 10 dBm. High resolution approx. 20 MHz or less. CE marked.

Optical Spectrum Analyzer 50 GHz. The Agilent 86140B is a benchtop optical spectrum analyzer for 50 GHz applications. The 86140B maintains most of the higher performance characteristics of the 86142B/86145B models while providing measurement solutions at value prices. With the 86140B you can quickly, easily and accurately characterize 50 GHz and wider WDM systems, optical sources and broadband components with its enhanced marker functionality, integrated power measurement capability and fast sweep speed.
Options 005, 006 built in 1550 nm EELED source and wavelength calibrator. Passes self test. CE marking.

Wide Bandwidth Oscilloscope. Modular platform for testing waveforms up 40 Gb/s. Simple Windows® based user interface. Compatible with Agilent 83480A series and 54750 series modules. Three high performance instruments in one, wide bandwidth sampling oscilloscope, digital communications analyzer and time domain reflectometer. CE marked.

Wide Bandwidth Oscilloscope. Modular platform for testing waveforms up 40 Gb/s. Simple Windows® based user interface. Compatible with Agilent 83480A series and 54750 series modules. Three high performance instruments in one, wide bandwidth sampling oscilloscope, digital communications analyzer and time domain reflectometer. CE marked.

Vacuum Base Probe Manipulator. Precision probe manipulator for precision placement of test pin on a wafer probe. 3 axis of linear motion.

Precision Semiautomatic Polisher Grinder. Eliminates the need for hand held polishing jigs and ensures that only the sample makes contact with the abrasive. Platen rotation speeds range from 5 to 350 RPM in either clockwise or counter clockwise direction. 8-inch dia. platen. Touch pad switches control all functions. Micrometer controlled vertical positioning of sample, 2 in. range. Digital dial indicator displays the sample material removal in 1 micron increments. 115V, 50/60 Hz, 3.3A.

Precision Semiautomatic Polisher Grinder. Eliminates the need for handheld polishing jigs and ensures that only the sample makes contact with the abrasive. Platen rotation speeds range from 5 to 350 rpm in either clockwise or counter clockwise direction. 8 in. dia. platen. Touch Pad switches control of all functions. Micrometer controlled vertical positioning of sample. Digital dial indicator displays the sample material removal in 1 micron increments (two). 115V, 1 Ph, 50/60 Hz, 3.3A.

Table Top Plasma System. For plasma cleaning of small parts or for modifying surfaces. Digital countdown timer. Analog pressure display. Gas flow with needle valve control. RF Power Source: 100W at 13.56 MHz. Quartz Chamber: 4 in. x 8 in. Includes vacuum pump. 110V, 60 Hz, 10A.

Multi-Wavelength Meter. Ideal for wavelength analysis in D-WDM systems. Highly accurate wavelength measurement, realizes high accuracy measurement of +/-0.003 nm. Capable of measurement of up to 256 channels. Large LCD color display. Wavelength Range: 1270 to 1650 nm. Max. Input Level: 10 dB.

Optical Test and Measurement System with AQ8201-21, 22, 110 Modules. For WDM device evaluation and maintenance. Halfsize Frame. AQ8201-21 OPM module optical power meter. AQ8201-22 Dual OPM module optical power meter. AQ8201-110 WDM DFB-LD module light source.