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Metrology

Used Dage DS50KG-CAL-A

Inventory Number: 37605
Now (USD): $450.00

Dage DS50KG-CAL-A Load Cell Calibration Weight.

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Used VLSI Standards Inc. Overlay Standards

Inventory Number: 44478
Now (USD): $450.00

VLSI Standards Inc. Absolute Contamination and Overlay Standards. ACS4-0.155C. ACS4-0.802C. ACS4-0.364C. ACS4-0.305C. ACS5-0.496. ACS6-0.364C. ACS6-0.364. OLS-4-1. $450 each.

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Used Veeco Bruker Wyko SP9900

Inventory Number: 58413
Now (USD): $59,000.00

Veeco Bruker Wyko SP9900 Large Format Optical Surface Profiler. Automated non-contact 3D critical dimension measurements. Large format surface profiling system delivers unmatched measurement performance on substrate panels, bumped substrates, flat panels and circuit boards for improved process monitoring and increased yields. High resolution imaging and patented vertical scanning interferometry system can perform accurate 3D critical dimension measurements with nanometer resolution. Powerful surface metrology instrument and defect inspection tool. Measurement Capability: Non-contact, three dimensional, surface, critical dimension, film thickness, tribology. Vertical Measurement Range: 0.1nm to 10mm. Vertical Resolution: Less than 0.1nm. RMS Repeatability: 0.01nm. No Cognex system. 115/230V, 1 Ph, 50/60 Hz, CE. Mfg.: 2008.

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