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Nanometrics

Used Nanometrics 8300X

Inventory Number: 59620
Now (USD): $21,500.00

Thin Film Metrology Tool. Unit gives robot error when powered up. Can accommodate 300mm wafers. Film thickness measurement system. Sold As Is.

Product Details

Used Nanometrics Nanospec 6100

Inventory Number: 62025
Now (USD): $39,000.00

Automated Film Thickness Measurement System. Tabletop film thickness measurement and mapping tool. Designed to measure the thickness of films deposited on various substrates including those used in semiconductor and magnetic head fabrication. Uses non-contact spectroreflectometry on sites as small as 10 micrometers. A computer sample stage and a robust autofocus system allows the automatic generation of film thickness uniformity maps. 115V, 50/60 Hz, 5A.

Product Details

Used Nanometrics Nanospec 6100

Inventory Number: 62660
Now (USD): $39,000.00

Automated Film Thickness Measurement System. Tabletop film thickness measurement and mapping tool. Designed to measure the thickness of films deposited on various substrates including those used in semiconductor and magnetic head fabrication. Uses non-contact spectroreflectometry on sites as small as 10 micrometers. A computer sample stage and a robust autofocus system allows the automatic generation of film thickness uniformity maps. 115V, 50/60 Hz, 5A.

Product Details

Used Nanometrics 3000

Inventory Number: 62774
Now (USD): $19,500.00

Tabletop Thin Film Analysis System. Film thickness measurement system that utilizes a modern small spot spectroscopic reflectometer that is built on a simple to use tabletop platform. The rugged, solid state linear diode array provides fast, precise measurements of single-layer films such as oxide, nitride and photoresist, as well as the top layer on film stacks of up to 3 layers in the thickness range of 250 angstrom to 35 micrometers. Simple and easy for the user to configure measurement programs and recipes for both simple and advanced measurement applications. Data management features include a database, statistical analysis, histograms and the ability to export data files.

Product Details