Used CDE Resmap 178

Inventory Number: 55143
Now (USD): Contact for Price

THIS UNIT IS SOLD. WE WOULD LIKE TO BUY YOUR CDE SYSTEMS. PLEASE CONTACT US IF YOU HAVE SYSTEMS TO SELL. * * * * * * * * * * * * * * * * * * * * * * * * * * Four Point Probe Resistivity Measurement System. Four point probe system for mapping resistivity on substrates from 2 in. to 8 in. dia. Manual loading of subtrates. Measurement Range: 2 milliohms/sq. to 5 megaohms/sq. Polar maps, rectangular maps, line scan or user defined patterns. 115/230V, 60 Hz.

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Used CDE Resmap 273

Inventory Number: 62246
Now (USD): $35,000.00

Large Substrate Resistivity Mapping System. Designed to meet the needs of 300 mm process development and large substrate film characterization. Can handle wafers from 2 in. to 12 in. dia. and square substrates up to 8.6 in. x 8.6 in. Polar maps, rectangular maps, line scan or user defined scans. 120V, 60 Hz, CE.

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