Signatone

Signatone S-1160MW-D6 Manual 6" Analytical Wafer Prober. Manual Probe System designed for reliable and accurate analytical testing of DC, CV-IV, and High-Power applications. Ease of use, single-handed X-Y Stage knobs for quick movement plus fine knob control. Quick platen lift with adjustable platen separation. Chuck fine rotation and lock. Steel platen accepts DC/HP/CAPPositioners (magnetic or vacuum mount). Mitutoyo Microscope with three long working distance objectives, 2x, 10x, 20x and 10x eyepieces. Vacuum chuck for 6" wafers and a spot for a reference sample.

Signatone S-1160A-5 Manual Analytical Wafer Probe Station. Wafer prober designed to support a broad range of precision probing applications. 5” diameter vacuum chuck with 5” x 5” stage travel. Linear platen lift. Platen accepts vacuum or magnetic base probe manipulators. Fine platen adjustment. Mitutoyo Microzoom microscope with two long working distance objectives.