Used Filmetrics F20 Advanced Thin Film Measurement System

Filmetrics F20 Advanced Thin Film Measurement System

Thickness, refractive index and extinction coefficient are measured quickly

and easily with the F20 advanced spectrometry system. Spectral analysis of

reflections from the top and bottom of the thin-film provides thickness and

optical constants (n and k) in seconds. Measurement Range: Thickness 100Å

to 50 μm, Optical Constants 1000Å to 10 μm. Thickness Accuracy:

+/- 1 nm at 500 nm thickness. Precision: 0.1 nm. Repeatability: 0.07 nm.

Includes set of calibration standards. 

110V, 50/60Hz