Equipment Photos

Equipment Details

Inventory Number: 62979
Category: Scanning Electron Microscopes
Manufacturer: Applied Materials

Defect Review System Scanning Electron Microscope. Came out of a working facility. Sold As Is Untested.

Now (USD): $49,000.00

Products Similar to: Applied Materials Semvision CX

Used Jeol JWS-7515

Inventory Number: 49809
Now (USD): $65,000.00

In-Line Wafer Inspection Electron Microscope. Field emission electron gun. Oxford ISIS EDS detector with cryo compressor (LN2 free operation). Resolution: 8 nanometer. Magnification: 100X to 200,000X. Accelerating voltage up to 12 kV. 4 axes goniometer stage. AS IS Price: $15,000.

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Used Jeol JWS-7555

Inventory Number: 52567
Now (USD): $49,000.00

Wafer Inspection SEM. Cassette to robot handling. Magnification to 200,000. Specimen Stage: 4 axis goniometer with 200 mm X-Y travel and tilt -15 to 60 degrees. Field emission electron gun. Date of Mfg.: 1999. CE marked. AS IS Price: $15,000.

Product Details

Used Jeol JWS-7515

Inventory Number: 52702
Now (USD): $65,000.00

In-Line Wafer Inspection Electron Microscope. Field emission electron gun. EDS detector with cryo compressor (LN2 free operation). Resolution: 8 nm. Magnification: 100X to 200,000X. Accelerating voltage up to 12 kV. 4 axis goniometer stage. AS IS Price: $15,000.

Product Details

Used Zeiss EVO 50

Inventory Number: 62256
Now (USD): $69,000.00

Research Grade Variable Pressure Scanning Electron Microscope. A broad range of applications in Nano Technology. The EVO 50 series provides a large chamber that can accommodate a variety of both conductive and non-conductive specimens in High Vacuum, Extended Variable Pressure (XVP®) or Extended Pressure (EP). The chamber can handle a 250mm dia. specimen. Equipped with cathode illumination detector, a Variable Pressure SED, a Four-Quadrant Backscatter Detector and an Oxford EDS System. Resolution: 3.0nm at 30 KV with SED and tungsten filament, 4.5nm at 30 KV with BSD and XVP mode. Motorized stage. Accelerating Voltage: 5 KV to 30 KV. Magnification: 5 to 1,000,000X. Powered by 100-240VAC, 1 Ph, 50/60 Hz, CE. Oxford EDS included but not tested or warranteed.

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Used Applied Materials Excite

Inventory Number: 45994
Now (USD): $7,000.00

High Speed Particle Detection System for Bare Wafer or Patterned Wafer Inspection. Inspects device wafers after processing is completed or inspects blanket films. Blanket films can be inspected at over 60 wafers per hour and patterned wafers at over 45 wph. .1 micrometer particle detection on unpatterned silicon. Windows NT operating system. Currently configured for 200mm wafers but can be configured for 300mm. Date of Mfg. 2003. Sold As Is with 30 day right of return.

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Used Applied Materials HDP Chamber

Inventory Number: 60239
Now (USD): $3,500.00

Was used for 200mm substrates. No turbo pump or other accessories. Only what is in photo.

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