Used MDA Scientific CM4

Automated Analytical Probe Station. Not complete, sold as is for parts.

Surface Analysis Particle Measuring System. Sizes and locates surface contamination and defects down to 0.10 micro-meters (PSL reference) in a fully automated 100mm - 200mm, cassette to cassette operation. The SAS 5800 includes teo polarized HE-NE Lasers which provide independent S and P polarization analysis. The contamination and defects are assigned as point, line and area defects. Accept/reject criteria is based on particle, scratch, area defect and STS (surface roughness). Sold As Is.

High Speed Particle Detection System for Bare Wafer or Patterned Wafer Inspection. Inspects device wafers after processing is completed or inspects blanket films. Blanket films can be inspected at over 60 wafers per hour and patterned wafers at over 45 wph. .1 micrometer particle detection on unpatterned silicon. Windows NT operating system. Currently configured for 200mm wafers but can be configured for 300mm. Date of Mfg. 2003. Sold As Is with 30 day right of return.

Single Point Toxic Gas Monitor. MDA Chemcassette reacts to trace quantities of a specific gas (or family of gases) darkening the tape in direct proportion to the concentration of a target gas present. No chem tapes supplied with unit.

Aerosol Particle Counting System. PC controller. Size Range: 0.1 to 2.0 micrometers. Flow Rate: 0.01 cfm. Automatic processing of up to 99 data samples, stores up to 1470 samples in a time series plot. 115V, 60 Hz.

FULLY TESTED AND READY TO SHIP!

Aerosol Particle Counting System. Manifold designed to provide multiplexed air sampling from remote collection points for introduction into to particle counter. 0.5 to 10 microns. AM-12-1.0 aerosol manifold with AM-12 pump. 115V, 60 Hz.

0.3 Micron Sensitivity Airborne Particle Counter. Battery operation for up to 3 hours continuous use. Sensitivity of 0.3 micron and a high flow rate of 1.0 cfm. Counts 6 sizes simultaneously. Performs both ISO 14644-1 and Z09E standard calculations. Built-in printer. Data storage of up to 2000 records, scrollable on LCD front panel. Programmable sample time and interval time. Stainless steel construction. CE Marking. 100-250V, 50/60 Hz.

Cell and Particle Counter with PC Option. The Beckman Coulter Z2 is the latest cell and particle counter of the Z Series. Following Z1, this model also makes use of the Coulter Principle known as Electrical Sensing Zone Method for counting and sizing cells. Accuracy, speed versatility and reproducibility is expected in the application of this technique. In addition to reporting both count and concentration results, the Beckman Z2 can provide size distribution of the cell population as well. This particle counter also has the ability to display various data between user selectable areas of the graph including the entire size distribution graph as well as the size statistics and counts. Moreover, the cursor positioned on the graph aids in determining the cumulative count and the cumulative number percent above and below a size. Mercury free. Sample result averaging. Size distribution graph and tabular data. PC data acquisition. One button calibration. 100-240V, 1 Ph, 50/60 Hz, CE.

Continuous Toxic Gas Monitor. User programmable dual level alarms. Output: 4 -20 mA. Built in thermal printer. 115V, 60 Hz.

Airborne Molecular Contamination Controller and Manifold. Unique touchscreen with a browser-like interface. The AMC Controller and Manifold regulates the flow of air provided to the connected AMC sensors (not included). Up to 32 sample port locations. Communicates with Lighthouse monitoring system and most other manufacturers distributed control systems, Building Automation Systems(BAS) and factory automation systems. Does not have internal pump. Date of Mfg.: 2004.