Used Jeol JWS-7515

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JWS-7515

Equipment Details

Inventory Number: 52702
Category: Scanning Electron Microscopes
Manufacturer: Jeol

In-Line Wafer Inspection Electron Microscope. Field emission electron gun. EDS detector with cryo compressor (LN2 free operation). Resolution: 8 nm. Magnification: 100X to 200,000X. Accelerating voltage up to 12 kV. 4 axis goniometer stage. AS IS Price: $15,000.

Now (USD): $65,000.00

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Used Jeol JWS-7515

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Now (USD): $65,000.00

In-Line Wafer Inspection Electron Microscope. Field emission electron gun. Oxford ISIS EDS detector with cryo compressor (LN2 free operation). Resolution: 8 nanometer. Magnification: 100X to 200,000X. Accelerating voltage up to 12 kV. 4 axes goniometer stage. AS IS Price: $15,000.

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Inventory Number: 49809
Now (USD): $65,000.00

In-Line Wafer Inspection Electron Microscope. Field emission electron gun. Oxford ISIS EDS detector with cryo compressor (LN2 free operation). Resolution: 8 nanometer. Magnification: 100X to 200,000X. Accelerating voltage up to 12 kV. 4 axes goniometer stage. AS IS Price: $15,000.

Product Details

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Wafer Inspection SEM. Cassette to robot handling. Magnification to 200,000. Specimen Stage: 4 axis goniometer with 200 mm X-Y travel and tilt -15 to 60 degrees. Field emission electron gun. Date of Mfg.: 1999. CE marked. AS IS Price: $15,000.

Product Details

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Inventory Number: 52718
Now (USD): $49,000.00

Wafer Inspection SEM with X-Ray Detector. Resolution: 5 nm. Magnification: 100X to 200,000X. Field emission electron gun. X-Y Stage Travel: 200 mm. $15,000 Sold As Is or $49,000 Refurbished.

Product Details