Category Feed Subscribe to this Channel's RSS Feed

Applied Materials

Used Applied Materials Excite

Inventory Number: 45994
Now (USD): $7,000.00

High Speed Particle Detection System for Bare Wafer or Patterned Wafer Inspection. Inspects device wafers after processing is completed or inspects blanket films. Blanket films can be inspected at over 60 wafers per hour and patterned wafers at over 45 wph. .1 micrometer particle detection on unpatterned silicon. Windows NT operating system. Currently configured for 200mm wafers but can be configured for 300mm. Date of Mfg. 2003. Sold As Is with 30 day right of return.

Product Details

Used Applied Materials HDP Chamber

Inventory Number: 60239
Now (USD): $3,500.00

Was used for 200mm substrates. No turbo pump or other accessories. Only what is in photo.

Product Details

Used Applied Materials Semvision CX

Inventory Number: 62979
Now (USD): $49,000.00

Defect Review System Scanning Electron Microscope. Came out of a working facility. Sold As Is Untested.

Product Details