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Wafer Analysis

Used Kruss FM40 EasyDrop

Inventory Number: 62365
Now (USD): $8,500.00

Contact Angle Measuring System. Computer controlled dosing. Regulable illumination. Digital image allows perfect drop shape analysis. Accuracy: +/- 0.1 degrees. 100-240V, 47-63 Hz, CE.

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Used Nanometrics 8300X

Inventory Number: 59620
Now (USD): $21,500.00

Thin Film Metrology Tool. Unit gives robot error when powered up. Can accommodate 300mm wafers. Film thickness measurement system. Sold As Is.

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Used Nanometrics Nanospec 6100

Inventory Number: 62025
Now (USD): $39,000.00

Automated Film Thickness Measurement System. Tabletop film thickness measurement and mapping tool. Designed to measure the thickness of films deposited on various substrates including those used in semiconductor and magnetic head fabrication. Uses non-contact spectroreflectometry on sites as small as 10 micrometers. A computer sample stage and a robust autofocus system allows the automatic generation of film thickness uniformity maps. 115V, 50/60 Hz, 5A.

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Used Nanometrics Nanospec 6100

Inventory Number: 62660
Now (USD): $39,000.00

Automated Film Thickness Measurement System. Tabletop film thickness measurement and mapping tool. Designed to measure the thickness of films deposited on various substrates including those used in semiconductor and magnetic head fabrication. Uses non-contact spectroreflectometry on sites as small as 10 micrometers. A computer sample stage and a robust autofocus system allows the automatic generation of film thickness uniformity maps. 115V, 50/60 Hz, 5A.

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Used Nanometrics 3000

Inventory Number: 62774
Now (USD): $19,500.00

Tabletop Thin Film Analysis System. Film thickness measurement system that utilizes a modern small spot spectroscopic reflectometer that is built on a simple to use tabletop platform. The rugged, solid state linear diode array provides fast, precise measurements of single-layer films such as oxide, nitride and photoresist, as well as the top layer on film stacks of up to 3 layers in the thickness range of 250 angstrom to 35 micrometers. Simple and easy for the user to configure measurement programs and recipes for both simple and advanced measurement applications. Data management features include a database, statistical analysis, histograms and the ability to export data files.

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Used SAT-SPECS Universal Surface Analysis

Inventory Number: 63122
Now (USD): $39,000.00

Surface Analysis System. Surface analysis chamber XPS, UPS, Kelvin, IPES. This was part of a larger chamber used to analyze substrates in an OLED production system. This unit was removed from the lab and detached from the rest of the OLED system. We are selling this analysis system As Is since we can not test it.

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Used Semilab WT-2000PVN

Inventory Number: 62628
Now (USD): $29,000.00

Multifunction Wafer Mapping Tool. Tabletop measurement system capable of performing a variety of measurements on PV cells, wafers and blocks. Configuration: Standard µ-PCD measurements. Max. 200 mm (8 in.) sample diameter on stage, manual loading. Wintau operating and evaluation software. Test: Minority lifetime accuracy and repeatability measurements on Semilab’s µ-PCD test sample. Diffusion length, internal quantum efficiency and reflectance accuracy and repeatability measurement on Semilab’s LBIC test sample. Test Wafers: 6-inch bare, polished, n-type wafer for µ-PCD test. (Id. V1020_035).

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Used Sun International Sopra GESP-5

Inventory Number: 58885
Now (USD): $21,500.00

Variable Angle Broadband Spectroscopic Ellipsometer. Ellipsometer for complicated film stacks, mapping film thickness and optical properties. Has PMT detector. Wavelength: 250nm to 850nm. User friendly Windows® based interface. SOPRA ellipsometer that had been serviced by Angstrom Sun Technologies. Allows for variable angle broadband spectroscopic ellipsometry. Motorized 8 in. stage for 3D sample plots. Camera with zoom lens.

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Used Tencor AS 500

Inventory Number: 62803
Now (USD): $15,000.00

Stylus Based Surface Profiler. Resolution to 1 angstrom and guaranteed repeatability of 10 angstrom. Accurately measures surface characteristics such as step height, roughness and etch depth on a wide variety of surface substrates. Extremely easy to use. Zoom optics provide magnification up to 210X for precise micro measurements. Stylus force adjustable between 1 and 100mg. Scan Length: 10mm. 115V, 50/60 Hz.

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Used Tousimis  Automegasamdri 915B

Inventory Number: 55992
Now (USD): Contact for Price

THIS UNIT IS SOLD. WE WOULD LIKE TO BUY YOUR TOUSIMIS SYSTEMS. PLEASE CONTACT US IF YOU HAVE SYSTEMS TO SELL. * * * * * * * * * * * * * * * * * * * * * * * * * * Supercritical 6 in. MEMS Wafer Critical Point Dryer. Microprocessor controller allows for complete automatic processing. Repeatable operating parameters. Chamber Size: 6.50 in. ID x 1.25 in. D. Can process up to 5 pieces of either 6 in., 4 in., 3 in., 2 in. wafers or 10mm sq. die per process run. LCO2 flow is controlled through micro. 120V, 50/60 Hz.

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