Wafer Analysis

Filmetrics F10-RT Thin Film Analyzer NEW IN THE BOX. Model 205-0863. Simultaneous Reflectance/Transmittance Measurements for Thin-Film Applications. The F10-RT requires only a mouse-click to capture both reflectance and transmittance spectra by eliminating time-consuming changes in hardware configuration. Data capture is fast – the array-based spectrometers typically take less than a second. Instantly reports minimum and maximum reflectance and transmittance values in user-configurablewavelength ranges. Color analysis is standard and can be displayed in common color-space systems (e.g. CIELAB and CIEXYZ) as well as visually. Measured spectra and other data can easily be printed and exported or can be saved in JPEG image format for easy distribution. Software Version 9.3.1.0, Customer must supply their own computer. Includes Filmetrics standards-Thickness standard, Dark, and 3 Reflectance standards. Units purchased new in 2019 and never used. Still in the box.

Filmetrics F20 Advanced Thin Film Measurement System. Thickness, refractive index and extinction coefficient are measured quickly and easily with the F20 advanced spectrometry system. Spectral analysis of reflections from the top and bottom of the thin-film provides thickness and optical constants (n and k) in seconds. Measurement Range: Thickness 100Å to 50 µm, Optical Constants 1000Å to 10 µm. Thickness Accuracy: +/- 1 nm at 500 nm thickness. Precision: 0.1 nm. Repeatability: 0.07 nm. 110V, 50/60Hz