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Thin Film Thickness Measuring Tool. Thickness is measured quickly and easily with Filmetrics advanced spectrometry systems. Spectral analysis of reflections from top and bottom of the thin film provides thickness in seconds. Example Layers: Virtually any smooth, translucent or lightly absorbing film may be measured. This includes Si02, Photoresist, Polysilicon, SiNx, Polymer Layers, Amorphous Silicon, DLC, Polimide. The F40 combines spectral reflectance with advanced analysis software for a multipurpose thickness measurement tool.