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Wafer Analysis

Used Tencor AS 200

Inventory Number: 61746
Now (USD): Contact for Price

Profiler. More information to come contact us for details.

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Used Tousimis AUTOMEGASAMDRI 915B

Inventory Number: 55992
Now (USD): Contact for Price

THIS UNIT IS SOLD. WE WOULD LIKE TO BUY YOUR TOUSIMIS SYSTEMS. PLEASE CONTACT US IF YOU HAVE SYSTEMS TO SELL. * * * * * * * * * * * * * * * * * * * * * * * * * * Supercritical 6 in. MEMS Wafer Critical Point Dryer. Microprocessor controller allows for complete automatic processing. Repeatable operating parameters. Chamber Size: 6.50 in. ID x 1.25 in. D. Can process up to 5 pieces of either 6 in., 4 in., 3 in., 2 in. wafers or 10mm sq. die per process run. LCO2 flow is controlled through micro. 120V, 50/60 Hz.

Product Details

Used Veeco Dektak 8

Inventory Number: 61093
Now (USD): $21,000.00

Stylus Based Surface Profiler. The Dektak 8 Advanced Development Profiler combines high repeatability, low-force sensor technology and advanced 3D data analysis for surface characterization of MEMS, semiconductors and other thin/thick films. The system provides 7.5 angstrom, 1 sigma step height repeatability and a vertical range of up to 1mm. Its overhead gantry design enables scan lengths to 200mm, for planarity and flatness measurements. 100-120V, 1 Ph, 50/60 Hz, CE.

Specification:
Vertical Range: 50 angstrom to 2,620 k angstrom (0.1 microinch to 10 mils).
Scan Length Range: 50 micrometers to 50mm (2 mils to 2 in.).
Scan Speed Ranges: 3 seconds to 200 seconds.
Software Leveling: Two-point programmable or cursor leveling.
Stylus Tracking Force: Programmable, 1-15mg.
Maximum Sample Thickness: 25.4mm (1 in.).
Sample Stage Diameter: Supports wafer size 50 mm to 200 mm (2 in. to 8 in.).

Product Details

Used Veeco Dektak 6M

Inventory Number: 57799
Now (USD): $2,950.00

Parts unit, not complete. Precision Surface Profiler. Precise step height measurements for thin films down to less than 100 angstroms. Low-inertia sensor technology. Programmable stylus force down to 1 milligram.Vertical range up to 262 microns. 10 angstroms, 1 sigma step height repeatability. Long scans up to 30mm. High resolution roughness measurements. Sample stage 150mm dia. 115V, 50/60 Hz, CE. Date of Mfg.: 12/05. Computer and Software missing. Sold As Is where is.

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Used Veeco Dektak 3

Inventory Number: 61153
Now (USD): $10,500.00

FULLY TESTED AND READY TO SHIP! 

Surface Profiler. Surface profile measuring system. Measures step height, surface roughness, waviness and curvature. High precision measurement for a broad range of applications. Sample Stage: 5 in. dia. Scan Length: 50 micrometers to 30mm. X-Y Stage Translation: 20mm to 80mm. Sensitivity to measure step heights below 100 angstroms. 120V, 60 Hz.

Product Details

Used Veeco Dektak 3030

Inventory Number: 61654
Now (USD): $4,500.00

Surface Proļ¬ler. Menu driven. Large sample stage. Wide range video zoom microscope for locating features 35X to 200X zoom. Can pre-program up to nine menus of measurement parameters. Scan lengths from 50 microns to 50 millimeters give you a lot of application latitude. Measurement Display Range: 100 angstrom to 130 kilo angstrom. Max.Vertical Resolution: 1 angstrom. Stylus Force Range: 1 mg to 40 mg. 120V, 60 Hz. Older unit but will be sold tested in good working condition.

Product Details

Used Veeco Dektak 6M

Inventory Number: 61710
Now (USD): $15,000.00

Surface Profiler High Precision R&D Measurement Tool. Delivers a unique combination of precise measurements, ease of use and simplicity of design all in a compact, economical package. Low-inertia sensor technology improves measurement repeatability. Programmable stylus force down to 1 milligram enables scanning on soft surfaces. Vertical range up to 262 microns measures large steps for MEMS applications. With 10 angstrom, 1 sigma step height repeatability the Dektak 6M provides the flexibility to perform precise step height measurements for thin films down to less than 100 angstroms as well as thick-film measurements up to several hundred microns thick. Long-scans up to 30mm. Extremely stable baseline. Up to 30,000 data points per scan. 120V, 60 Hz, CE.

Product Details

Used Wyko BP2000W

Inventory Number: 39319
Now (USD): $39,000.00

Bump Measurement Profiling System. The right inspection tool for flip-chip process control. Repeatably measures solder bump heights, from 150 micro-meters or more for standard flip-chip bumps down to a few microns for under-bump metalization pads, as well as provides volume data on all bump sizes. Non-contact 3-D data on all size bumps over the entire wafer. The system calculates bump height, width, volume and coplanarity. Automatically detects bump position, solder bridges, and missing and extra solder bumps, with prominent display of pass/fail results and position statistics at the bump, die,wafer and lot level. Powerful measurement analysis, generating output as 2-D cross sections, contour plots, bearing ratio plots, or 3-D images. A built in Wizard allows quick measurement set-up.

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Used Wyko Profiler

Inventory Number: 61243
Now (USD): $2,950.00

Noncontact Profiler. Sold As Is untested for parts or a project machine. We have not powered the system. Two objectives: IX50 and IX5.

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Used Zygo SXM300

Inventory Number: 46204
Now (USD): $12,500.00

Multimode Scanning Probe Microscope. The Magnascope SXM300 is a multimode probe microscope that measures sub-micron features to near angstrom-level resolution. It is designed for critical-dimension measurements of height, width, roughness and sidewall angles of 300mm wafers and masks of up to 9 in x 9 in. Sold As Is.

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