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Wafer Analysis

Used GSI Lumonics VOY 1212

Inventory Number: 47972
Now (USD): $8,500.00

High Performance Non-Contact Metrology System. Fully automatic. Windows® operating system. Easy to program and use. Powerful view metrology software. Measuring Range: 300 x 300 x 150mm. 115V, 50/60 Hz, 15A.

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Used JMAR S2610-01

Inventory Number: 50626
Now (USD): $6,000.00

Non-Contact Automatic 3-Axis Tabletop Measurement System. JMAR Video CMM® software. Supports high magnification microscope optics. Three channel computer controlled light source. X-Y stage travel: 10 in. x 4 in. 115V, 60 Hz. Mfg. 2001.

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Used KLA Tencor 5200

Inventory Number: 61777
Now (USD): Contact for Price

Overlay Measurement System. More information to come contact us for details.

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Used Metricon PC-200

Inventory Number: 49158
Now (USD): $2,950.00

Prism Coupler. For measurement of thin film thickness and refractive index.

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Used Metricon PC-2000

Inventory Number: 54118
Now (USD): $2,950.00

Thin Film Thickness and Refractive Index Measurement System. Unparalleled accuracy in measurement of thin film thickness, refractive index and bulk refractive index. Prism coupler instrument. 115V, 60 Hz.

Product Details

Used Nanometrics 8300X

Inventory Number: 59620
Now (USD): $21,500.00

Thin Film Metrology Tool. Unit gives robot error when powered up. Can accommodate 300mm wafers. Film thickness measurement system. Sold As Is.

Product Details

Used Optical Gaging Products IQ 1000

Inventory Number: 25673
Now (USD): $950.00

Three-Dimensional Video Coordinate Measuring System. Automatically analyzes video images of objects for dimensional measurements. The IQ then takes those measurements and compares them to nominal values and tolerances to identify conditions of non-conformance. Includes 4 basic subsystems: Mechanical Motion System. Imaging System: Consisting of the image forming optics, illumination devices, and the image sensing video camera. Image Processing system: The feature extraction, identification, and measurement capabilities. Operator Workstation: Computer and input devices where all programming operations are executed and where measurement results and machine status are displayed. Sold As Is.

Product Details

Used Philips PLM-100

Inventory Number: 48787
Now (USD): $22,500.00

Photoluminescence Mapping Tool. For process control, analysis of band-gap, ternary layer composition, layer thickness and crystal perfection.

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Used Prometrix UV 1050

Inventory Number: 38377
Now (USD): $19,500.00

Film Thickness Mapping System. Fully automated system produces highly accurate, precise, and stable measurements of film thickness, reflectivity, and refractive index on monitor and patterned wafers. Windows® based software with Stattrax® Statistical Tracking Software.

Product Details

Used Rudolph Auto El III

Inventory Number: 59156
Now (USD): $4,950.00

Ellipsometer. Displays film thickness, index, order thickness, substrate N and K on transparent films. Max. Sample Size: 6 in. x 6 in. Variable angle of incidence, manual adjust. Single Wavelength: 632.8nm. Null seeking operating principle.

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