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Wafer Analysis

Used Gaertner L26

Inventory Number: 58135
Now (USD): $8,500.00

Simple Manual Ellipsometer with PC Controller. Manual stage. PC controller with software. Reliable HeNe laser source. Small 15 micron measuring spot. 115V, 50/60 Hz.

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Used Gaertner L2W16D.830

Inventory Number: 58267
Now (USD): $1,297.00

Multiwavelength 200mm Ellipsometer. Missing computer and stage driver. Two wavelength ellipsometers use additional laser sources to analyze difficult films. 8 in. dia. stage with motorized stage, no controller. Sold As Is with 30 day ROR.

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Used GSI Lumonics VOY 1212

Inventory Number: 47972
Now (USD): $8,500.00

High Performance Non-Contact Metrology System. Fully automatic. Windows® operating system. Easy to program and use. Powerful view metrology software. Measuring Range: 300 x 300 x 150mm. 115V, 50/60 Hz, 15A.

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Used JMAR S2610-01

Inventory Number: 50626
Now (USD): $6,000.00

Non-Contact Automatic 3-Axis Tabletop Measurement System. JMAR Video CMM® software. Supports high magnification microscope optics. Three channel computer controlled light source. X-Y stage travel: 10 in. x 4 in. 115V, 60 Hz. Mfg. 2001.

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Used Metricon PC-200

Inventory Number: 49158
Now (USD): $2,950.00

Prism Coupler. For measurement of thin film thickness and refractive index.

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Used Metricon PC-2000

Inventory Number: 54118
Now (USD): $2,950.00

Thin Film Thickness and Refractive Index Measurement System. Unparalleled accuracy in measurement of thin film thickness, refractive index and bulk refractive index. Prism coupler instrument. 115V, 60 Hz.

Product Details

Used Metricon 2010

Inventory Number: 60851
Now (USD): $9,500.00

Triple Wavelength Prism Coupler Thin Film Thickness and Refractive Index/Birefringence Measurement System. Offers unique advantages over instruments based on ellipsometry or spectrophotometry. No advance knowledge of thickness or index required. Measures thickness and index for each film of dual film structures. Index accuracy of +/- .001 and resolution of +/- .0005. Accepts substrates up to 200 mm sq. Rapid measurement of film doping. Measurement on transparent substrates. 633 nm, 1300 nm and 1550 nm lasers.

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Used Nanometrics 8300X

Inventory Number: 59620
Now (USD): $21,500.00

Thin Film Metrology Tool. Unit gives robot error when powered up. Can accommodate 300mm wafers. Film thickness measurement system. Sold As Is.

Product Details

Used Optical Gaging Products IQ 1000

Inventory Number: 25673
Now (USD): $950.00

Three-Dimensional Video Coordinate Measuring System. Automatically analyzes video images of objects for dimensional measurements. The IQ then takes those measurements and compares them to nominal values and tolerances to identify conditions of non-conformance. Includes 4 basic subsystems: Mechanical Motion System. Imaging System: Consisting of the image forming optics, illumination devices, and the image sensing video camera. Image Processing system: The feature extraction, identification, and measurement capabilities. Operator Workstation: Computer and input devices where all programming operations are executed and where measurement results and machine status are displayed. Sold As Is.

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Used Philips PLM-100

Inventory Number: 48787
Now (USD): $22,500.00

Photoluminescence Mapping Tool. For process control, analysis of band-gap, ternary layer composition, layer thickness and crystal perfection.

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