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Wafer Analysis

Used August Technology NSX-85

Inventory Number: 57564
Now (USD): $45,000.00

Automated Defect Inspection System. Inspection of whole wafers, sawn wafers, JEDEC trays, Auer boats, die in gel/waffle paks, MCM’s. Detects defects down to 0.5 micron. Automated wafer mapping and identification. Automated data collection and reporting. Menu-based, easy to use Windows environment. 200-240V, 1 Ph, 50/60 Hz, 5A, CE.

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Used CDE Resmap 178

Inventory Number: 55143
Now (USD): Contact for Price

THIS UNIT IS SOLD. WE WOULD LIKE TO BUY YOUR CDE SYSTEMS. PLEASE CONTACT US IF YOU HAVE SYSTEMS TO SELL. * * * * * * * * * * * * * * * * * * * * * * * * * * Four Point Probe Resistivity Measurement System. Four point probe system for mapping resistivity on substrates from 2 in. to 8 in. dia. Manual loading of subtrates. Measurement Range: 2 milliohms/sq. to 5 megaohms/sq. Polar maps, rectangular maps, line scan or user defined patterns. 115/230V, 60 Hz.

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Used CDE Resmap 178

Inventory Number: 60653
Now (USD): $25,000.00

FULLY TESTED AND READY TO SHIP!

Four Point Probe Resistivity Mapping System. Designed to meet the needs of process development and tool characterization engineers, this four point probe has the accuracy, repeatability and reliability required. Wafer Size: 2 to 8 in. manual load. Typical Measurement Time: 1 sec. per site. Mapping Patterns: Polar map (align with notch/flat; rectangular map (choose inside edge exclusion); line scan (diameter, radius or any point to point diameter, minimum step 0.1mm); user defined (template). Measurement Range: 2 milliohms per sq. to 5 megaohms per sq. (can be optimized to 1 milliohm per sq.).

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Used Cyberoptics Cyberscan 200

Inventory Number: 50584
Now (USD): $4,950.00

Non-Contact Profile Measurement System. Uses laser triangulation to analyze two dimensional data. Non-contact measurement allows you to work with wet and fragile samples. PC controller analyzes data. Motorized stage. 120V, 60 Hz.

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Used Daini Seikosha SFT/156

Inventory Number: 34297
Now (USD): $250.00

Fluorescent X-Ray Measurement System. X-Y Stage: 3 in. x 3 in. Travel Z. Adjustment: 1.3 in. Min. Measurement area: .005 in. Sold AS IS.

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Used Filmetrics F40

Inventory Number: 61671
Now (USD): $13,500.00

FULLY TESTED AND READY TO SHIP! Video Demonstration Available.

Thin Film Thickness Measuring Tool. Thickness is measured quickly and easily with Filmetrics advanced spectrometry systems. Spectral analysis of reflections from top and bottom of the thin film provides thickness in seconds. Example Layers: Virtually any smooth, translucent or lightly absorbing film may be measured. This includes Si02, Photoresist, Polysilicon, SiNx, Polymer Layers, Amorphous Silicon, DLC, Polimide. The F40 combines spectral reflectance with advanced analysis software for a multipurpose thickness measurement tool.

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Used Flexus F2320

Inventory Number: 53896
Now (USD): Contact for Price

THIS UNIT IS SOLD. WE WOULD LIKE TO BUY YOUR FLEXUS SYSTEMS. PLEASE CONTACT US IF YOU HAVE SYSTEMS TO SELL. * * * * * * * * * * * * * * * * * * * * * * * * * * Dual Wavelength 500 deg C Scanning Thin Film Stress Measurement System. Detects conditions that lead to reliability problems such as cracking,voiding, lifting and hillock formation. Wafer topography can be displayed in both 2-D and 3-D views. User programmable scan range up to 150 mm. Measurement Range: 2 x 10^2 to 4 x 10^10 dyne/cm^2. 115V, 50/60 Hz, 10A.

Product Details

Used Gaertner L106C

Inventory Number: 57351
Now (USD): $9,500.00

Large Stage Ellipsometer. Permits noncontact thickness and refractive index measurements of thin transparent and semi-transparent films. Manual hand positioning 15 in. dia. stage. PC with Windows based software. 115V, 60 Hz.

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Used Gaertner L26

Inventory Number: 58135
Now (USD): $8,500.00

Simple Manual Ellipsometer with PC Controller. Manual stage. PC controller with software. Reliable HeNe laser source. Small 15 micron measuring spot. 115V, 50/60 Hz.

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Used Gaertner L2W16D.830

Inventory Number: 58267
Now (USD): $1,297.00

Multiwavelength 200mm Ellipsometer. Missing computer and stage driver. Two wavelength ellipsometers use additional laser sources to analyze difficult films. 8 in. dia. stage with motorized stage, no controller. Sold As Is with 30 day ROR.

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